发明名称 PRODUCTION METHOD OF STENCIL MASK BLANK AND STENCIL MASK, STENCIL MASK BLANK AND STENCIL MASK
摘要 PROBLEM TO BE SOLVED: To provide means of removing a residue generating on a mesh-like wall and on a silicon active layer surface without roughening the surface when the mesh-like wall for supporting the silicon active layer is formed by dry-etching a silicon layer from an SOI substrate.SOLUTION: A production method of a stencil mask blank is provided, including steps of: forming a hard mask layer, which has alkali durability and dry etching durability and which can be stripped with hydrofluoric acid, on a support layer surface of an SOI substrate having a three-layer structure; forming a protective layer, which has alkali durability and can be stripped with hydrofluoric acid, on an active layer surface; forming a resist pattern on the hard mask layer surface; forming an opening by dry-etching the hard mask layer and the support layer by using the resist pattern; removing a side wall residue of the support layer with a strong alkali chemical liquid; and removing an intermediate layer and the protective layer by using hydrofluoric acid.
申请公布号 JP2013186387(A) 申请公布日期 2013.09.19
申请号 JP20120052937 申请日期 2012.03.09
申请人 TOPPAN PRINTING CO LTD 发明人 SAKAI TAKAKO
分类号 G03F1/68;G03F1/20 主分类号 G03F1/68
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