| 摘要 |
A microscope is provided. The microscope includes: a detection section for detecting the measurement light; a first image acquisition section emitting the visible light onto a detection surface to obtain an optical image; and a switch mirror or beam splitter disposed on a light path, along which the measurement light from the analysis position of the sample is guided to the detection section. The microscope further includes a second image acquisition section that is disposed in a position apart from the light path of the detection section for obtaining an optical image of a large area which includes the analysis position of the sample, wherein the optical image of the large area is larger than an optical image of an area, which includes the analysis position of the sample, obtained by the first image acquisition section. |
