发明名称 TEMPLATE MATCHING ALIGNMENT METHOD AND CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To eliminate a matching error and perform alignment with excellent accuracy.SOLUTION: A control computer of a charged particle beam device: registers a plurality of templates (S10); separately performs matching processing of the registered templates on an observation image (S13); calculates a representative coordinate difference vector indicating a difference between a positional coordinate on the observation image of the template when the matching is successful and a positional coordinate on design, and a matching record value (S14); groups the calculated representative coordinate difference vector on the basis of the size and direction (S16); selects a group with the largest number of the representative coordinate difference vectors which belong to the group (S17); selects the template with the highest matching record value among the templates which belong to the selected group (S18); and associates the positional coordinate at the time of observation with the positional coordinate on design using the representative coordinate difference vector calculated with respect to the selected template (S19).
申请公布号 JP2013187157(A) 申请公布日期 2013.09.19
申请号 JP20120053701 申请日期 2012.03.09
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ONIZAWA AKIHIRO;HOJO YUTAKA;KAWAHARA TOSHIICHI
分类号 H01J37/22;H01J37/28;H01L21/66 主分类号 H01J37/22
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