发明名称 |
TEMPLATE MATCHING ALIGNMENT METHOD AND CHARGED PARTICLE BEAM DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To eliminate a matching error and perform alignment with excellent accuracy.SOLUTION: A control computer of a charged particle beam device: registers a plurality of templates (S10); separately performs matching processing of the registered templates on an observation image (S13); calculates a representative coordinate difference vector indicating a difference between a positional coordinate on the observation image of the template when the matching is successful and a positional coordinate on design, and a matching record value (S14); groups the calculated representative coordinate difference vector on the basis of the size and direction (S16); selects a group with the largest number of the representative coordinate difference vectors which belong to the group (S17); selects the template with the highest matching record value among the templates which belong to the selected group (S18); and associates the positional coordinate at the time of observation with the positional coordinate on design using the representative coordinate difference vector calculated with respect to the selected template (S19). |
申请公布号 |
JP2013187157(A) |
申请公布日期 |
2013.09.19 |
申请号 |
JP20120053701 |
申请日期 |
2012.03.09 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
ONIZAWA AKIHIRO;HOJO YUTAKA;KAWAHARA TOSHIICHI |
分类号 |
H01J37/22;H01J37/28;H01L21/66 |
主分类号 |
H01J37/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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