发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress operation of a parasitic MOSFET formed under a bird's beak of a LOCOS oxide film without separately injecting a P-type impurity into a semiconductor layer in NchMOSFET arranged in an element region surrounded by the LOCOS oxide film formed in the semiconductor layer on an insulating layer.SOLUTION: A gate electrode 19 is formed of polysilicon having a P-type polysilicon portion 19a and an N-type polysilicon portion 19b. The gate electrode 19 is disposed on a LOCOS oxide film 9 extending from a P-type channel region 15 in a channel width direction. The P-type polysilicon portion 19a of the gate electrode 19 is disposed across from the LOCOS oxide film 9 to the P-type channel region 15 so as to stride over at least a bird's beak 9a of the LOCOS oxide film 9. The N-type polysilicon portion 19b of the gate electrode 19 is disposed on the P-type channel region 15.
申请公布号 JP2013187442(A) 申请公布日期 2013.09.19
申请号 JP20120052632 申请日期 2012.03.09
申请人 RICOH CO LTD 发明人 ONO KATSUYUKI
分类号 H01L29/786;H01L21/28;H01L21/336;H01L21/8238;H01L27/08;H01L27/092;H01L29/423;H01L29/49 主分类号 H01L29/786
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