发明名称 SYSTEM, METHOD, AND COMPUTER READABLE MEDIUM FOR EVALUATING PARAMETERS OF NANOMETER-SIZED FEATURE PART
摘要 PROBLEM TO BE SOLVED: To provide a CD-SEM which can measure a feature part other than a line or a via, which can be measured by a typical CD-SEM.SOLUTION: This invention relates to a non-temporary computer readable medium, system, and method. The method includes: acquiring an image of a portion to be measured including a feature part by an image acquisition module, where the image of the portion to be measured includes an image of the feature part; processing by an image processor the image of the portion to be measured to provide an imitated image of an imitated feature part different from the feature part; applying a measurement algorithm which is unsuitable to measure parameters of the feature part, to measure parameters of the imitated feature part and provide a measurement result; and determining values of the parameters of the feature part in response to the measurement result.
申请公布号 JP2013186128(A) 申请公布日期 2013.09.19
申请号 JP20130046125 申请日期 2013.03.08
申请人 APPLIED MATERIALS ISRAEL LTD 发明人 YUVAL YAHAV;OFER ADAN
分类号 G01B15/00;G01B15/04;H01J37/22;H01L21/027 主分类号 G01B15/00
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