| 摘要 |
PROBLEM TO BE SOLVED: To improve a fault detection rate.SOLUTION: A logical block of a reconfigurable circuit includes: an operation part; first and second flip-flops; a first selection part that sets a first data path from the operation part to a first node as either one of a first path including the first flip-flop and a first through path not including the first flip-flop; and a second selection part that sets a second data path from the first node to an output end of the logical block as either one of a second path including the second flip-flop and a second through path not including the second flip-flop. The second selection part selects the second through path as the second data path in a normal operation, selects the second through path as the second data path in a test in which the first path is selected, and selects the second path as the second data path in a test in which the first through path is selected. |
