发明名称 MANUFACTURING APPARATUS AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing apparatus and a manufacturing method of a semiconductor device, which can prevent a contaminated ion other than an intended ion to be implanted into a substrate.SOLUTION: A manufacturing apparatus of a semiconductor device according to an embodiment comprises an electrode generation part, a gas introduction part and an atmospheric pressure adjustment part. The electron generation part generates an electron used in the case where an intended ion is implanted into a substrate in a predetermined processing chamber. The gas introduction part introduces to the inside of the processing chamber, a gas containing an element which combines with a contaminated ion generated inside the processing chamber. The atmospheric pressure adjustment part decreases an atmospheric pressure inside the processing chamber to an atmospheric pressure lower than an atmospheric pressure outside the processing chamber.
申请公布号 JP2013187017(A) 申请公布日期 2013.09.19
申请号 JP20120050604 申请日期 2012.03.07
申请人 TOSHIBA CORP 发明人 KUGINO KOJI;JINGUJI MASAYUKI
分类号 H01J27/08;H01J37/08;H01J37/317;H01L21/265 主分类号 H01J27/08
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