发明名称 EPITAXIAL WAFER MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an epitaxial wafer manufacturing method which can improve yield of an electronic device which is manufactured by using an epitaxial wafer in which a nitride semiconductor is formed on an Si substrate.SOLUTION: An epitaxial wafer manufacturing method comprises a first process (S1) of cleaning an Si substrate by wet etching; a second process (S2) of cleaning the Si substrate by dry etching after the first process (S1); and a third process (S3) of epitaxial growing a nitride semiconductor on the Si substrate after the second process (S2).
申请公布号 JP2013187285(A) 申请公布日期 2013.09.19
申请号 JP20120050220 申请日期 2012.03.07
申请人 SHARP CORP 发明人 TERAGUCHI NOBUAKI
分类号 H01L21/205;C23C16/02;H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/205
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