发明名称 SEMICONDUCTOR DEVICE, RECORDING DEVICE AND MANUFACTURING METHODS OF THOSE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of forming a DMOS transistor and a CMOS transistor on the same semiconductor substrate.SOLUTION: In a manufacturing method of a semiconductor device which includes a DMOS transistor, an NMOS transistor and a PMOS transistor, the DMOS transistor is formed adjacent to a top face of a semiconductor substrate and includes a first impurity region N-202 having the same conductivity with a drain and a source and low impurity concentration, and a second impurity region P-203 having conductivity opposite to that of the first impurity region. The first impurity region is formed to surround a drain region and the second impurity region is formed to surround a source region. The process of forming the DMOS transistor includes a first process of forming the first impurity region concurrently with a well of one of the NMOS transistor and the PMOS transistor, and a second process of forming the second impurity region so as to be adjacent to the first impurity region and concurrently with a well of the other of the NMOS transistor and the PMOS transistor.
申请公布号 JP2013187263(A) 申请公布日期 2013.09.19
申请号 JP20120049717 申请日期 2012.03.06
申请人 CANON INC 发明人 SUZUKI NOBUYUKI;SUZUKI SATOSHI;OMURA MASANOBU
分类号 H01L21/8234;H01L27/088 主分类号 H01L21/8234
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