发明名称 MAGNETIC INSPECTION SYSTEM FOR MAGNETIC SENSORS
摘要 PROBLEM TO BE SOLVED: To allow each of a plurality of test devices to inspect magnetic properties of a three-dimensional magnetic sensor with a simple configuration while eliminating influences of magnetic fields from adjacent devices in an environment where the plurality of test devices are placed side-by-side, which makes it unnecessary to secure a magnetic shield room and a large installation space for keeping distance between each device.SOLUTION: A test magnetic field generator coil of a first magnetic test device and a canceling magnetic field generator coil of a second magnetic test device are brought into electrical contact by aligning one of the three axes of each coil. The canceling magnetic field generator coil generates a canceling magnetic field whose intensity is inversely proportional to a square of a distance ratio L2/L1 against a test magnetic field generated by the test magnetic field generator coil, where L1 is a distance from the test magnetic field generator coil to a test region of the first magnetic test device and L2 is a distance from the test magnetic field generator coil to a test region of the second magnetic test device. Each magnetic test device inspects a three-dimensional magnetic sensor while canceling a magnetic field from the second magnetic test device acting on a test region thereof using a canceling magnetic field generator coil.
申请公布号 JP2013186053(A) 申请公布日期 2013.09.19
申请号 JP20120053129 申请日期 2012.03.09
申请人 YAMAHA CORP 发明人 FUKUZAKI NORIFUMI;WAKUI YUKIO;SATO HIDEKI
分类号 G01R33/02;G01R35/00 主分类号 G01R33/02
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