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发明名称
FAULT TESTING FOR INTERCONNECTIONS
摘要
申请公布号
EP2389596(B1)
申请公布日期
2013.09.18
申请号
EP20100702372
申请日期
2010.01.22
申请人
SILICON IMAGE, INC.
发明人
SUL, CHINSONG;AHN, GIJUNG
分类号
G01R31/317
主分类号
G01R31/317
代理机构
代理人
主权项
地址
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