| 摘要 |
PURPOSE: A socket, a socket board, and an electronic component test apparatus are provided to replace separately an anisotropic conductive member as necessary, thereby reducing the cost of the socket. CONSTITUTION: A socket (7A) comprises a first insulating member (10A) and a plurality of anisotropic conductive members (20A). The first insulating member comprises a plurality of first through holes (11A). The first through hole comprises a first opening (114) and a second opening (115). The first opening is formed in a first circumferential surface (12) of the first insulating member. The width (R4) of the first opening is smaller than the maximum width (R2) of the anisotropic conductive member. The second opening is formed in a second circumferential surface (13) close to a wiring substrate (40) than the first circumferential surface in the first insulating member. The width (R5) of the second opening is more than the maximum width of the anisotropic conductive member. The anisotropic conductive member is detachably inserted into the first through hole and electrically connects the terminal of a tested electronic component and the pad of the wiring substrate. |
