发明名称 Method of manufacturing a semiconductor device and semiconductor device
摘要 A method of manufacturing a semiconductor device has forming, in a dielectric film, a first opening and a second opening located in the first opening, forming a first metal film containing a first metal over a whole surface, etching the first metal film at a bottom of the second opening using a sputtering process and forming a second metal film containing a second metal over the whole surface, and burying a conductive material in the second opening and the first opening.
申请公布号 US8536708(B2) 申请公布日期 2013.09.17
申请号 US201213605020 申请日期 2012.09.06
申请人 AKIYAMA SHINICHI;KAWAMURA KAZUO;SAKAI HISAYA;WATATANI HIROFUMI;OKUBO KAZUYA;FUJITSU SEMICONDUCTOR LIMITED 发明人 AKIYAMA SHINICHI;KAWAMURA KAZUO;SAKAI HISAYA;WATATANI HIROFUMI;OKUBO KAZUYA
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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