发明名称 |
NICKELIDE SOURCE/DRAIN STRUCTURES FOR CMOS TRANSISTORS |
摘要 |
<p>PURPOSE: A nickelide source/drain structure for a CMOS transistor is provided to rapidly increase the speed of a device by forming a contact scheme of low resistivity. CONSTITUTION: A source/drain region (28) is adjacent to a gate structure. The source/drain region includes a channel material (22). The channel material is at least binary material. A metal contact structure (42) is combined with the source/drain material (34). The source/drain material is made of a low resistance metal.</p> |
申请公布号 |
KR20130102480(A) |
申请公布日期 |
2013.09.17 |
申请号 |
KR20130021957 |
申请日期 |
2013.02.28 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
OXLAND RICHARD KENNETH;VAN DAL MARK |
分类号 |
H01L21/8238;H01L21/336;H01L29/78 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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