| 摘要 |
An inspection method for an active-matrix substrate including the scanning lines, the data lines, the pixels disposed in matrix, and the power lines. The pixel includes: an organic EL device; a drive transistor; a capacitor; a selection transistor having a gate connected to the scanning line and connected between the data line and the gate of the drive transistor, and the guard potential transistor having a gate connected to a source of the selection transistor, a source connected to a drain of the selection transistor, and a drain connected to the power line. The inspection method includes: a writing process for writing a charge in the capacitor; a reading process for reading the written charged from the capacitor; and a holding process for holding the charge for a predetermined period from the end of the writing process to the start of the reading process.
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