发明名称 |
MEASURING METHOD FOR INTERFACIAL ADHESION STRENGTH OF FILM |
摘要 |
PURPOSE: A method for measuring the interfacial adhesion of a thin film is provided to separate the thin film from a substrate after forming pre-cracks on the substrate, thereby easily measuring the interfacial adhesion of the thin film. CONSTITUTION: A method for measuring the interfacial adhesion of a thin film (104) includes the following steps of: arranging an indenter (200) on a surface of a substrate opposite to a surface in which the thin film of a target object is formed; forming cracks (106) on the substrate by applying a first press-in load to the target object by the indenter; and separating the thin film from the substrate by applying a second press-in load to the other surface of the target object and measuring the interfacial adhesion of the thin film. |
申请公布号 |
KR101309046(B1) |
申请公布日期 |
2013.09.16 |
申请号 |
KR20120044346 |
申请日期 |
2012.04.27 |
申请人 |
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE |
发明人 |
LEE, YUN HEE;KIM, YONG IL;HAHN, JUN HEE |
分类号 |
G01N19/04;G01N3/02 |
主分类号 |
G01N19/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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