发明名称 MEASURING METHOD FOR INTERFACIAL ADHESION STRENGTH OF FILM
摘要 PURPOSE: A method for measuring the interfacial adhesion of a thin film is provided to separate the thin film from a substrate after forming pre-cracks on the substrate, thereby easily measuring the interfacial adhesion of the thin film. CONSTITUTION: A method for measuring the interfacial adhesion of a thin film (104) includes the following steps of: arranging an indenter (200) on a surface of a substrate opposite to a surface in which the thin film of a target object is formed; forming cracks (106) on the substrate by applying a first press-in load to the target object by the indenter; and separating the thin film from the substrate by applying a second press-in load to the other surface of the target object and measuring the interfacial adhesion of the thin film.
申请公布号 KR101309046(B1) 申请公布日期 2013.09.16
申请号 KR20120044346 申请日期 2012.04.27
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 LEE, YUN HEE;KIM, YONG IL;HAHN, JUN HEE
分类号 G01N19/04;G01N3/02 主分类号 G01N19/04
代理机构 代理人
主权项
地址