发明名称 SEMICONDUCTOR WAFER AND METHOD FOR TESTING THE SAME
摘要 A semiconductor wafer includes semiconductor chips divided by a dicing line, one of the semiconductor chips including terminals of an identical potential; a wiring located on the dicing line, and electrically connecting the terminals to each other; and a pad electrically connected through the wiring to the terminals, wherein the pad is located entirely on the semiconductor chip and is not present on the dicing line.
申请公布号 US2013234750(A1) 申请公布日期 2013.09.12
申请号 US201213602784 申请日期 2012.09.04
申请人 TAKASO JUN;MITSUBISHI ELECTRIC CORPORATION 发明人 TAKASO JUN
分类号 G01R31/26;H01L23/48 主分类号 G01R31/26
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