| 摘要 |
PROBLEM TO BE SOLVED: To provide a chip for specimen analysis which has high mass productivity and is not polluted in a measurement instrument.SOLUTION: The chip for specimen analysis has a contact part with which a specimen sample is brought into contact, an introduction passage, an accumulation part, and an inspection hole. In the chip for specimen analysis, the chip is made of a laminate obtained by laminating an upper base material layer/intermediate base material layer/lower base material layer in this order, a thermal adhesive resin layer A is formed and an air hole is punched and formed on a rear face of the upper base material layer, the thermal adhesive resin layer B is formed on the front face of the intermediate base material layer, and a thermal adhesive resin layer C is formed on a rear face of the intermediate base material layer, respectively, the contact port, the accumulation part, and the introduction passage are punched, removed and formed, a thermal adhesive resin layer D is formed, and the inspection hole is punched and formed on the front face of the lower base material layer, a membrane filter is thermally adhered and arranged on the front face of the thermal adhesive resin layer D so as to cover the inspection hole, and the upper base material layer, the intermediate base material layer and the lower base material layer are thermally adhered through the thermal adhesive resin layers A to D and laminated. |
