发明名称 METHOD FOR USING SAMPLING CLOCK GENERATION DEVICE FOR FREQUENCY SCAN TYPE OCT, AND SAMPLING CLOCK GENERATION DEVICE FOR FREQUENCY SCAN TYPE OCT
摘要 PROBLEM TO BE SOLVED: To provide a long measurable distance by a device for generating an accurate sampling clock in an SS-OCT, and to eliminate a ghost appearing in an OCT image because the accuracy of a sampling clock is bad.SOLUTION: The sampling clock generation device generates a sine wave as a sampling clock, and uses a low frequency noise reduction filter in order to eliminate low frequency noise in a clock signal. Such a low frequency noise reduction filter is used, which makes the maximum value of a spectral intensity of noise after transmitting the low frequency noise reduction filter to be about 60% or below of the spectral intensity of the signal. In addition, a frequency scanning light source is used, wherein noise to be spectral intensity of about 60% or more of the spectral intensity of the signal is closer to a low frequency side than to a frequency band of the signal in an intensity spectrum of a sampling clock before using a high pass filter, and the frequency band of the signal is separate from a frequency band of the noise by about 5 MHz or more.
申请公布号 JP2013181790(A) 申请公布日期 2013.09.12
申请号 JP20120044618 申请日期 2012.02.29
申请人 SYSTEMS ENGINEERING INC 发明人 HIWATARI FUMIKO;NIIMURA YASUO;YAMADA HISAFUMI
分类号 G01N21/17 主分类号 G01N21/17
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