发明名称 Mass properties measuring apparatus and method
摘要 PURPOSE: A device and a method for measuring mass properties are provided to measure the mass properties by setting once without using other devices, thereby minimizing time required for measuring the mass properties. CONSTITUTION: A device for measuring mass properties comprises a rotating unit(100), a support unit(200), a driving unit(300), a first measuring unit(400), a second measuring unit(500), a third measuring unit, and a twist period measuring unit(700). The rotating unit includes a measuring table(110) where a measurement object(10) is placed on. The support unit supports the rotating unit to be rotatable. The driving unit rotates the rotating unit. The first measuring unit measures reaction when the rotating unit is tilted. The second measuring unit measures the reaction of centrifugal force generated when the rotating unit is rotated. The third measuring device is arranged separately from the second measuring device and measures the reaction of the centrifugal force generated when the rotating unit is rotated.
申请公布号 KR101306016(B1) 申请公布日期 2013.09.12
申请号 KR20110131214 申请日期 2011.12.08
申请人 发明人
分类号 G01G9/00 主分类号 G01G9/00
代理机构 代理人
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