发明名称 CIRCUIT FOR TESTING MOTHERBOARD
摘要 A circuit includes first to third nodes, resistors with different resistance, capacitors with different capacitance, first switches corresponding to the same number of resistors, second switches corresponding to the same number of capacitors, and a third switch. A first terminal of each resistor is connected to the first node. A second terminal of each resistor is connected to a first terminal of a corresponding one first switch, a second terminal of each first switch is connected to the second node. A first terminal of the third switch is connected to the second terminal of each first switch. A second terminal of the third switch is connected to a first terminal of each capacitor. A second terminal of each capacitor is connected to a first terminal of a corresponding one second switch. A second terminal of each second switch is connected to the third node.
申请公布号 US2013234776(A1) 申请公布日期 2013.09.12
申请号 US201213535520 申请日期 2012.06.28
申请人 HUANG FA-SHENG;HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD. 发明人 HUANG FA-SHENG
分类号 H03K17/00 主分类号 H03K17/00
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