发明名称 WIRING STRUCTURE
摘要 <p>Provided is an interconnection structure that, in a display device such as an organic EL display or a liquid crystal display, has superior workability during wet etching even without providing an etch stop layer. The interconnection structure has, in the given order, a substrate, a semiconductor layer of a thin film transistor, and a metal interconnection film, and has a barrier layer between the semiconductor layer and the metal interconnection film. The semiconductor layer comprises an oxide semiconductor, the barrier layer has a layered structure of a high-melting-point metal thin film and a Si thin film, and the Si thin film is directly connected to the semiconductor layer.</p>
申请公布号 KR20130101085(A) 申请公布日期 2013.09.12
申请号 KR20137012216 申请日期 2011.10.11
申请人 KABUSHIKI KAISHA KOBE SEIKO SHO 发明人 MAEDA TAKEAKI;KUGIMIYA TOSHIHIRO
分类号 H01L29/786;G02F1/136;H01L21/28 主分类号 H01L29/786
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