发明名称 ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE FILM USING THE SAME, AND PATTERN FORMING METHOD
摘要 An object of the present invention is to provide an actinic ray-sensitive or radiation-sensitive resin composition that can form independent line patterns with high resolution and excellent shapes and shows excellent resist performances including roughness characteristics, and to provide an actinic ray-sensitive or radiation-sensitive film and a pattern forming method using the composition. The actinic ray-sensitive or radiation-sensitive resin composition contains a compound (P) that contains at least one phenolic hydroxyl group and at least one group in which a hydrogen atom of a phenolic hydroxyl group is substituted with a group represented by the following General Formula (1) (the respective symbols in the formula represent the same definitions as in the claims and the specification).
申请公布号 KR101305067(B1) 申请公布日期 2013.09.11
申请号 KR20120059666 申请日期 2012.06.04
申请人 发明人
分类号 G03F1/22;G03F7/00;G03F7/004 主分类号 G03F1/22
代理机构 代理人
主权项
地址