发明名称 ELECTRONIC COMPONENT TEST SYSTEM
摘要 <p>PURPOSE: An electronic component test system is provided to improve the effectiveness of a test process by using a same carrier board for mediating the electrical contact between an electronic component and a tester. CONSTITUTION: A first tester executes a first test(510) process about an electronic component. A first handler(520) is used for electrically connecting an electronic component to the first tester. A second tester executes a second test(530) process about the electronic component which is tested by the first tester. A second handler(540) is used for electrically connecting an electronic component to the second tester. A carrier board is carried with the first handler and the second handler and mediates electrical connection between the electronic component, the first tester, and the second tester.</p>
申请公布号 KR101304275(B1) 申请公布日期 2013.09.11
申请号 KR20080095673 申请日期 2008.09.30
申请人 发明人
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
代理机构 代理人
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