发明名称 HIGH SPEED APPARATUS FOR ATOMIC LAYER DEPOSITION
摘要 PURPOSE: An apparatus for depositing with a thickness of an atomic layer at a high speed is provided to implement a deposition process with rotating a lower chamber and an upper chamber, thereby remarkably improving productivity. CONSTITUTION: An apparatus for depositing with a thickness of an atomic layer at a high speed includes a lower chamber (10), a chamber rotation rail, a first fixing frame (12), an upper chamber (20), and a second fixing frame (21). Substrates are placed on the ring-shaped lower chamber at equal distances, and the lower chamber is rotated by a driving unit. The chamber rotation rail guides the rotation of the lower chamber. The first fixing frame supports and fixes the chamber rotation rail. A first module and a second module are alternately installed at the upper chamber at a certain distance, and respectively feed and discharge a first reacting substance and a second reacting substance. The second fixing frame fixes the upper chamber.
申请公布号 KR101306627(B1) 申请公布日期 2013.09.11
申请号 KR20130012735 申请日期 2013.02.05
申请人 DAE HEUNG PRECISION INDUSTRY CO., LTD. 发明人 KIM, MEYNG HA
分类号 C23C16/44;C23C16/448;H01L21/205 主分类号 C23C16/44
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