发明名称 Semiconductor device and manufacturing method thereof
摘要 An object is to provide a semiconductor device which solves a problem that can occur when a substrate having an insulating surface is used. The semiconductor device includes a base substrate having an insulating surface; a conductive layer over the insulating surface; an insulating layer over the conductive layer; a semiconductor layer having a channel formation region, a first impurity region, a second impurity region, and a third impurity region provided between the channel formation region and the second impurity region over the insulating layer; a gate insulating layer configured to cover the semiconductor layer; a gate electrode over the gate insulating layer; a first electrode electrically connected to the first impurity region; and a second electrode electrically connected to the second impurity region. The conductive layer is held at a given potential.
申请公布号 US8530333(B2) 申请公布日期 2013.09.10
申请号 US20100721298 申请日期 2010.03.10
申请人 ISOBE ATSUO;GODO HIROMICHI;SHINOHARA SATOSHI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 ISOBE ATSUO;GODO HIROMICHI;SHINOHARA SATOSHI
分类号 H01L21/46 主分类号 H01L21/46
代理机构 代理人
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