| 摘要 |
A method for inspecting the width of a coated film in accordance with the present disclosure is a method for detecting a width W1 of a coated film 20, the method including: a step of measuring a thickness profile in the transverse direction of the coated film 20; a step of creating approximating curves L1, L2 of a function of a distance X and a thickness Y in end-proximal regions 24a, 24b of both ends of the coated film 20; and a step of taking a distance Xe1 corresponding to a thickness threshold Yt determined from the approximating curve L1 of one end-proximal region 24a and a distance Xe2 corresponding to the thickness threshold Yt determined from the approximating curve L2 of the other end-proximal region 24b, and of calculating Xe1-Xe2 as the width W1.
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