发明名称 Nitride shallow trench isolation (STI) structures and methods for forming the same
摘要 A shallow trench isolation (STI) structure and methods for forming the same provide an STI structure with a top surface formed completely of silicon nitride. The methods for forming the STI structures provide for at least one nitride deposition step followed by a further nitride deposition step to re-fill divots that occur along the upper portions of the trench sidewalls.
申请公布号 US8530327(B2) 申请公布日期 2013.09.10
申请号 US201113222698 申请日期 2011.08.31
申请人 PIPER DANIEL;CHIANG FRANKLIN;YERUBANDI GANESH;WAFERTECH, LLC 发明人 PIPER DANIEL;CHIANG FRANKLIN;YERUBANDI GANESH
分类号 H01L21/76 主分类号 H01L21/76
代理机构 代理人
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