发明名称 Etching method of thin film
摘要 Example methods may provide a thin film etching method. Example thin film etching methods may include forming a Ga—In—Zn—O film on a substrate, forming a mask layer covering a portion of the Ga—In—Zn—O film, and etching the Ga—In—Zn—O film using the mask layer as an etch barrier, wherein an etching gas used in the etching includes chlorine. The etching gas may further include an alkane (CnH2n+2) and H2 gas. The chlorine gas may be, for example, Cl2, BCl3, and/or CCl3, and the alkane gas may be, for example, CH4.
申请公布号 KR101303578(B1) 申请公布日期 2013.09.09
申请号 KR20070001578 申请日期 2007.01.05
申请人 发明人
分类号 H01L21/3065 主分类号 H01L21/3065
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