发明名称 METHOD FOR ADJUSTING MAGNETIZATION DEVICE OF INSPECTION OBJECT
摘要 PROBLEM TO BE SOLVED: To realize magnetic particle inspection which can provide high magnetic particle inspection accuracy throughout an X-Y plane, a Y-Z plane, and a Z-X plane.SOLUTION: Magnetic field intensities along an X axis, a Y axis, and a Z axis in a region where an inspection object is installed are detected by a three-dimensional probe 51. One or more of a first Lissajous waveform based on magnetic field intensities along the X axis and the Y axis, a second Lissajous waveform based on magnetic field intensities along the Y axis and the Z axis, and a third Lissajous waveform based on magnetic field intensities along the Z axis and the X axis are observed by an oscilloscope 53 connected to a tesla meter 52. A position or a direction of a tri-polar yoke type magnetizer 10 or a bi-polar yoke type magnetizer 20 and a frequency ratio of an AC voltage to be applied to the tri-polar yoke type magnetizer 10 or the bi-polar yoke type magnetizer 20 are adjusted so that a value of an aspect ratio of the observed Lissajous waveform approximates to 1.
申请公布号 JP2013178280(A) 申请公布日期 2013.09.09
申请号 JP20130127879 申请日期 2013.06.18
申请人 DENSHI JIKI KOGYO KK 发明人
分类号 G01N27/84 主分类号 G01N27/84
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