| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that data duplication and the addition of an energy storage function make it difficult to increase the area of a semiconductor device and to secure required power consumption even though the normality/abnormality of data recorded to normally operate a reactivated system is required to be recorded in a semiconductor device in the case that power supply fed to the semiconductor device is shut off during writing operation of a nonvolatile memory cell.SOLUTION: The semiconductor device includes a first selection circuit (XDEC_R) and a second selection circuit (YSEL) for selecting a nonvolatile memory cell of a memory cell array (MA), and a voltage monitoring circuit (V_DTC) for detecting power shutdown to output a monitor signal (ERR_DTC). The second selection circuit switches writing of the nonvolatile memory cell from electron injection by tunnel current to electron injection by a hot electron in response to the monitor signal. |
