发明名称 RANGE SENSOR AND RANGE IMAGE SENSOR
摘要 A first semiconductor area (FD1) is arranged inside of a charge generating area, in which charge is generated in response to incident light, so as to be surrounded by the charge generating area, and collects signal charge from the charge generating area. A third semiconductor area (FD31) is arranged outside of the charge generating area so as to surround said area, and collects unnecessary charge from the charge generating area. A photogate electrode (PG1) is arranged on the charge generating area. A first gate electrode (TX1) is arranged between the first semiconductor area (FD1) and the charge generating area, and causes the signal charge from the charge generating area to flow into the first semi conductor area (FD1) in response to an input signal. A third gate electrode (TX31) is arranged between the third semiconductor area (FD31) and the charge generating area, and causes the unnecessary charge from the charge generating area to flow into the third semi conductor area (FD31) in response to an input signal.
申请公布号 WO2013128714(A1) 申请公布日期 2013.09.06
申请号 WO2012JP78363 申请日期 2012.11.01
申请人 HAMAMATSU PHOTONICS K.K. 发明人 MASE MITSUHITO;SUZUKI TAKASHI;HIRAMITSU JUN
分类号 G01S17/89;G01C3/06;H01L27/146;H01L31/10 主分类号 G01S17/89
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