CONNECTOR FOR SEMICONDUCTOR DEVICE TESTING EQUIPMENT AND TEST BOARD FOR BURN-IN TESTER

摘要

PURPOSE: A connector for semiconductor device testing equipment and a test board for a burn-in tester thereof are provided to improve processing capacity by increasing the number of semiconductor devices, capable of being loaded on the test board. CONSTITUTION: A connector (120) comprises multiple connecting pins (121), multiple ground plates (122), and an accommodating frame (123). The multiple connecting pins are inserted into the insertion grooves of an arm connector for being connected electrically with the electrical contact terminal of a connecting target and being arranged in a matrix form. A plate is mounted between the columns of the connecting pins and equipped in a plate shape to improve the properties of electrical signals transmitted through the connecting pins. The accommodating frame accommodates and supports the connecting pins and the ground plate.