发明名称 PANTOGRAPH MEASUREMENT METHOD, AND PANTOGRAPH MEASUREMENT DEVICE
摘要 <p>A pantograph measurement method by means of image processing comprising a process (S1) for acquiring a video image of a marker (50) disposed on a pantograph (40) and for generating a space-time image from the acquired video, and a process (S2) for searching for the marker (50) by comparing the search patterns in accordance with the height of the space-time image, wherein: the marker (50) has a stripe pattern in which a first region (51) that cannot easily reflect light and a second region (52) that can easily reflect light are alternately disposed, at least two second regions (52) are disposed, and the stripe width of the second regions are different from one another; and the search pattern corresponds to the stripe pattern of the marker.</p>
申请公布号 WO2013129153(A1) 申请公布日期 2013.09.06
申请号 WO2013JP53826 申请日期 2013.02.18
申请人 MEIDENSHA CORPORATION 发明人 WATABE, YUSUKE;NIWAKAWA, MAKOTO
分类号 G01B11/00;B60L5/26;B60M1/28 主分类号 G01B11/00
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