发明名称 SPECTROSCOPIC INSPECTION DEVICE
摘要 <p>A Raman spectroscopic inspection device includes a light source generating light, a first optical fiber guiding an incident light incident from the light source, a coupler connected to one end portion of the first optical fiber to branch off a path of the light, a second optical fiber connected to the coupler to guide the incident light to a sample and to guide an emission light emitted from the sample, a first lens positioned between an end portion of the second optical fiber and the sample to form focuses of the incident light and the emission light, a third optical fiber connected to the coupler to guide the emission light, a detector positioned at an end portion of the third optical fiber to receive the emission light and to generate analysis data.</p>
申请公布号 WO2013129755(A1) 申请公布日期 2013.09.06
申请号 WO2012KR09121 申请日期 2012.11.01
申请人 SAMSUNG TECHWIN CO.,LTD. 发明人 KWON, KANG HYUK
分类号 G01N21/65;G02B6/10 主分类号 G01N21/65
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