发明名称 Inspecting method for the rubbing state on alignment layer forming on substrate
摘要 An inspecting method for a rubbing state on alignment layer forming on substrate is provided to check the rubbing state stably and improve the inspection accuracy of a naked eye. An inspecting method for a rubbing state on alignment layer forming on substrate includes: forming a liquid crystal layer on the rubbed orientation film at the substrate having the orientation film which the rubbing process is completed; measuring retardation value at the substrate having the liquid crystal layer through a rubbing detecting device; and conforming whether the measured retardation value is involved in an error range or not to discriminate whether the rubbing has error. The inspecting method for the rubbing state on alignment layer forming on the substrate includes: forming the liquid crystal layer on the rubber orientation film at the substrate; and discriminating if the rubbing has the error by using color change of the liquid crystal layer.
申请公布号 KR101305366(B1) 申请公布日期 2013.09.06
申请号 KR20060123466 申请日期 2006.12.07
申请人 发明人
分类号 G02F1/13;G02F1/1337 主分类号 G02F1/13
代理机构 代理人
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