发明名称 CONTACT ETCH STOP LAYERS OF A FIELD EFFECT TRANSISTOR
摘要 A field effect transistor, the field effect transistor includes a substrate including a surface and a gate structure including sidewalls and a top surface, the gate structure being positioned over the substrate. The field effect transistor further includes a spacer adjacent to the sidewalls of the gate structure and a first contact etch stop layer over the spacer and extending along the surface of the substrate. The field effect transistor further includes an interlayer dielectric layer adjacent to the first contact etch stop layer, wherein a top surface of the interlayer dielectric layer is coplanar with the top surface of the gate structure. The field effect transistor further includes a second contact etch stop layer over at least a portion of the top surface of the gate structure.
申请公布号 US2013228834(A1) 申请公布日期 2013.09.05
申请号 US201313858687 申请日期 2013.04.08
申请人 MANUFACTURING COMPANY, LTD. TAIWAN SEMICONDUCTOR;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 TEO LEE-WEE;ZHU MING;YOUNG BAO-RU;CHUANG HARRY-HAK-LAY
分类号 H01L29/78 主分类号 H01L29/78
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