| 摘要 |
An automated X-ray inspection system employing phase shift profilometry (PSP) and three dimensional (3D) surface modeling for improving inspection of an object, includes at least one projector for projecting light to the object, at least one optical lens for imaging a light pattern obtained from the object to at least one camera, the at least one camera being adapted to capture a plurality of images of the object. The light passing from the projector lens of the at least one projector illuminates the object thereby generating the light pattern to be imaged from the object to the at least one camera via the at least one optical lens.
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