发明名称 SPECIMEN INSPECTION SYSTEM, INSPECTION CARTRIDGE AND SPECIMEN INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent a used inspection cartridge from being reused in a specimen inspection system for measuring substance to be inspected in specimen solution by using the inspection cartridge.SOLUTION: In a specimen inspection system comprising a case with an opening 11 for supplying specimen solution to an inside formed, an inspection cartridge 10 arranged in the case to have a test area TL for reacting on substance to be inspected to be subjected to coloration, and a specimen inspection device 1 having a cartridge insertion port 3 for receiving the inspection cartridge 10 to inspect a specimen by measuring a coloration state of the test area TL of the received inspection cartridge 10, the inspection cartridge 10 includes a cover 15 located to expose the opening 11 before using a cartridge to move a position for covering the opening 11 in cooperation with means 3a of the specimen inspection device 1 side when the inspection cartridge 10 is inserted into the cartridge insertion port 3.
申请公布号 JP2013174519(A) 申请公布日期 2013.09.05
申请号 JP20120039567 申请日期 2012.02.27
申请人 FUJIFILM CORP 发明人 INENA KATSUYA
分类号 G01N33/543 主分类号 G01N33/543
代理机构 代理人
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