发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which a memory composed of an oxide semiconductor of quite-small leakage current is added to a flip flop and used and which can temporarily hold data without significantly changing electrical characteristic of a transistor including the oxide semiconductor of quite-small leakage current in a channel region.SOLUTION: In a semiconductor device, a channel length of a transistor including an oxide semiconductor in a channel region is made larger than a channel length of a transistor including silicon in a channel region thereby to inhibit shift of a threshold voltage to a negative side more than a case where the channel lengths are the same. In particular, when assuming that a channel length of the transistor including silicon in the channel region is Ls and a channel length of the transistor including the oxide semiconductor in the channel region is Lo, a ratio Ls/Lo is not less than 1/200 and not more than 1/6.
申请公布号 JP2013175708(A) 申请公布日期 2013.09.05
申请号 JP20130005091 申请日期 2013.01.16
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 OUMARU TAKUO;SHIONOIRI YUTAKA
分类号 H01L27/105;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;H01L29/786;H03K3/356 主分类号 H01L27/105
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