发明名称 THIN FILM FORMATION METHOD AND APPARATUS
摘要 PROBLEM TO BE SOLVED: To form an oxide thin film, which can be used as a gate oxide film of a field effect transistor, at a low temperature.SOLUTION: A metal oxide thin film is formed by repeating: a first step for adsorbing organic metal gas molecules on a deposition surface by holding a deposition object at 0°C-150°C, and introducing organic metal gas onto the deposition surface of the deposition object; and a second step for oxidizing and decomposing the organic metal gas molecules thus adsorbed into a metal oxide by introducing plasmatized steam onto the deposition surface to which the organic metal gas molecules are adsorbed, and forming a hydroxyl group on that surface.
申请公布号 JP2013175720(A) 申请公布日期 2013.09.05
申请号 JP20130011476 申请日期 2013.01.24
申请人 HIROSE FUMIHIKO 发明人 HIROSE FUMIHIKO;IZUGAI MOTOMU
分类号 H01L21/316;C23C16/40;H01L21/31 主分类号 H01L21/316
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