发明名称 APPARATUS AND METHOD FOR DEPOSITING FILM
摘要 PROBLEM TO BE SOLVED: To control precisely by a simple method so as to locally increase a film thickness, in manufacturing a film on a film deposition surface 50a of a substrate by plasma CVD method.SOLUTION: A film deposition apparatus for depositing a film on a film deposition surface 50a of a substrate 50 by plasma CVD method includes: a vacuum chamber 10 for performing the plasma CVD method; a power supply 20 for causing a source gas to turn to plasma; a magnet 60 arranged on an opposite surface side to the film deposition surface 50a of the substrate 50 as a magnetic field generation source; and a shielding plate 70 formed of a high magnetic permeability material and arranged between the substrate 50 and the magnet 60 as a shielding member. A film thickness of a film 80 to be deposited on the substrate 50 is controlled by adjusting a shape and an arrangement manner of the shielding plate 70. Thus, the film deposition apparatus can finely control a film thickness by adjusting the shape and arrangement of the shielding plate 70 without complicating the arrangement and shape of the magnet 60 or the adjustment of magnetic field intensity.
申请公布号 JP2013173973(A) 申请公布日期 2013.09.05
申请号 JP20120038378 申请日期 2012.02.24
申请人 SEIKO EPSON CORP 发明人 SHOJI SHUNICHI;SATO MASARU
分类号 C23C16/44;C23C16/50 主分类号 C23C16/44
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