发明名称 BEAM MONITOR SYSTEM AND PARTICLE BEAM IRRADIATION SYSTEM
摘要 Disclosed is a beam monitor system in which signals outputted from a plurality of wires are divided in a multi-wire type monitor for measuring a beam profile of a charged particle beam, an identical number of the wires are grouped, the signals of the respective groups are taken out one piece by one piece to be connected with each other, and the number of the pieces, corresponding to a number of the wires belonging to the one group, are put together to be connected to a signal processor storing connection information.
申请公布号 US2013231517(A1) 申请公布日期 2013.09.05
申请号 US201313776062 申请日期 2013.02.25
申请人 HITACHI, LTD. 发明人 IWAMOTO TOMOHISA;HORI YOSHIHITO;MATSUSHITA TAKAYOSHI;MORIYAMA KUNIO;TADOKORO MASAHIRO
分类号 G01T1/29;A61N5/10 主分类号 G01T1/29
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