发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 A method for manufacturing a semiconductor integrated circuit device includes the step of forming an SOI device region and a bulk device region on an SOI type semiconductor wafer. The method includes: removing a BOX layer and an SOI layer in a bulk device region; and thereafter forming an STI region in both the SOI device region and the bulk device region. In the method, the STI region in the SOI device region is formed to extend through the BOX layer.
申请公布号 US2013230964(A1) 申请公布日期 2013.09.05
申请号 US201313781737 申请日期 2013.02.28
申请人 RENESAS ELECTRONICS CORPORATION 发明人 IMAI AKIRA;IWAMATSU TOSHIAKI;NAKAE AKIHIRO
分类号 H01L21/76;H01L21/68 主分类号 H01L21/76
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