发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to improve a withstand voltage between a drain and a gate and to suppress the increase of on-resistance. CONSTITUTION: A second conductive buried layer (2) is formed on a first conductive semiconductor substrate (1). A second conductive epitaxial layer (3) is formed on the second conductive buried layer. A trench (8) is formed on the second conductive epitaxial layer. A first conductive body region (4) is formed around the side of the trench. A gate insulation layer (10) is formed on the inner wall of the trench. A gate electrode (11) is formed by filling the trench with polycrystalline silicon. |
申请公布号 |
KR20130098913(A) |
申请公布日期 |
2013.09.05 |
申请号 |
KR20130019179 |
申请日期 |
2013.02.22 |
申请人 |
SEIKO INSTRU KABUSHIKI KAISHA, ALSO TRADING AS SEIKO INSTRUMENTS INC. |
发明人 |
MINAMI YUKIMASA |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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