发明名称 METHOD FOR MANUFACTURING CONTACT PROBE
摘要 A method for manufacturing a contact probe includes: a lithography step of obtaining a resin mold by forming a pattern for the contact probe, a pattern for a tie bar in a shape of a frame therearound, and a pattern for a coupling portion coupling these two patterns, in a resist formed on a conductive substrate, by lithography; an electroforming step of forming a layer made of a metal material on the resin mold by electroforming to form a metal structure in which the contact probe is integral with the tie bar at the coupling portion; a removal step of removing the resin mold and the conductive substrate; a plating step of forming a plating layer on a surface of the metal structure by electroplating after the removal step; and a separation step of separating the contact probe from the metal structure after the plating step.
申请公布号 US2013227835(A1) 申请公布日期 2013.09.05
申请号 US201213885610 申请日期 2012.08.16
申请人 CHIBA YUKIFUMI;NITTA KOJI;TOKUDA TAKESHI;SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 CHIBA YUKIFUMI;NITTA KOJI;TOKUDA TAKESHI
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
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