发明名称 THROUGH HOLE FORMATION METHOD AND MANUFACTURING METHOD OF SILICON SUBSTRATE HAVING THROUGH HOLE FORMED BY THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a through hole formation method, etc. which inhibits misalignment of center axes of holes formed on both surfaces of a substrate, also inhibits the occurence of notching without causing metal contamination thereby improving the dimensional accuracy, and performs dry etching to form through holes on the silicon substrate.SOLUTION: In a through hole formation method, through holes are formed in a silicon substrate by dry etching. The through hole formation method includes steps of: forming a composite substrate by fixing the silicon substrate to a support substrate supporting the silicon substrate; and performing dry etching to the composite substrate from the silicon substrate side thereby forming the through holes in the silicon substrate. A support substrate, in which holes are formed in regions corresponding to through hole formation regions of the silicon substrate and located on a surface of the support substrate which contacts with the silicon substrate, is used as the support substrate.
申请公布号 JP2013175497(A) 申请公布日期 2013.09.05
申请号 JP20120037406 申请日期 2012.02.23
申请人 CANON INC 发明人 IGARASHI YOICHI
分类号 H01L21/3065;B81C1/00 主分类号 H01L21/3065
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