发明名称 |
METHOD FOR ANALYSING PHOTOVOLTAIC LAYER SYSTEMS USING THERMOGRAPHY |
摘要 |
A method for the evaluative analysis of a photovoltaic layer system is described. The method applies to a semiconductor layer forming a pn junction: an electric current is generated in the layer system; a spatially resolved thermal image of the surface of the layer system is generated; an intensity distribution of the thermal radiation relative to the respective number of pixels with the same intensity value is determined; an intensity mean/median from the intensity distribution is determined; an intensity interval based on a specifiable measure for a scattering of the intensity distribution is determined; a characteristic number is determined; and the characteristic number or a calculation value based thereon is compared with a specifiable reference characteristic number. |
申请公布号 |
KR20130098379(A) |
申请公布日期 |
2013.09.04 |
申请号 |
KR20137010710 |
申请日期 |
2011.09.28 |
申请人 |
SAINT-GOBAIN GLASS FRANCE |
发明人 |
DALIBOR THOMAS |
分类号 |
G01N25/72;G01R31/26;G01R31/265 |
主分类号 |
G01N25/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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