发明名称
摘要 PROBLEM TO BE SOLVED: To provide a method determining capacitor deterioration highly accurately. SOLUTION: An internal resistance deterioration index depending on an internal resistance of the capacitor and changing monotonously relative to increase of the internal resistance, and a capacitance deterioration index depending on the capacitance and changing monotonously relative to decline of the capacitance, are calculated from measurement results of the internal resistance and the capacitance. A rectangle using as two diagonal vertexes, a starting point at which both an increase amount of the internal resistance and a decrease amount of the capacitance become zero and a tolerance limit point at which both the increase amount of the internal resistance and the decrease amount of the capacitance become each tolerance limit value, is defined in an orthogonal coordinate system using one index as one axis and the other index as the other axis. A first boundary line connecting a point on one side between a pair of sides in connection with the starting point of the rectangle to a point on the other side is defined. It is determined whether a point showing a present state shown by the calculated two indexes exceeds the first boundary line as a view from the starting point. The deterioration state of the capacitor is determined based on a determination result. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP5283515(B2) 申请公布日期 2013.09.04
申请号 JP20090003278 申请日期 2009.01.09
申请人 发明人
分类号 G01R31/00;E02F9/26;H02J7/00;H02M3/155 主分类号 G01R31/00
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