发明名称 Debugger based memory dump using built in self test
摘要 A method and apparatus for performing a memory dump. The method includes providing a memory location from a debugger to a memory array through a BIST wrapper, and receiving data by the debugger read from the memory location in the memory array. The method can include sending a dump enable signal from the debugger, and the BIST wrapper selectively providing the memory location to the memory array in response to the dump enable signal. The method can include sending the dump enable signal to a multiplexer coupled to a register in the BIST wrapper, the dump enable signal causing the multiplexer to load the register with the memory location. The method can include asynchronously sending a write disable signal to the memory array before reading the data from the memory location. The received data can be selected from a larger set of data read from the memory location.
申请公布号 US8527825(B2) 申请公布日期 2013.09.03
申请号 US20100886629 申请日期 2010.09.21
申请人 KIM HONG S.;POLICKE PAUL F.;BASSETT PAUL DOUGLAS;QUALCOMM INCORPORATED 发明人 KIM HONG S.;POLICKE PAUL F.;BASSETT PAUL DOUGLAS
分类号 G01R31/28 主分类号 G01R31/28
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